Explores atoms and radiation lineshapes, covering linewidths, lifetime broadening, and broadening mechanisms, including Lorentzian and Doppler effects.
Covers X-Ray Photoelectron Spectrometry (XPS), a surface analysis technique developed by Kai Siegbahn, explaining its components, mechanism, and analysis methods.
Explores electromagnetic wave propagation, including Poynting vector, irradiance, dipole radiation, dielectric constant, and natural linewidth in atoms and radiation.
