Person
Claudia Cancellieri
This person is no longer with EPFL
Related publications (8)
Experimental and ab initio derivation of interface stress in nanomultilayered coatings: Application to immiscible Cu/W system with variable in-plane stress
Pandula Manura Liyanage, Claudia Cancellieri, Giacomo Lorenzin
Interface stress is a fundamental descriptor for interphase boundaries and is defined in strict relation to the interface energy. In nanomultilayers with their intrinsically high interface density, the functional properties are dictated by the interface st ...
Elsevier2024Electronic and structural characterization of barrier-type amorphous aluminium oxide
Alfredo Pasquarello, Patrik Schmutz, Francesco Ambrosio, Claudia Cancellieri, Raheleh Partovi Nia, Roland Hauert, Fabio Evangelisti
The structural, electronic, and dielectric properties of barrier -type anodic Al oxides prepared with various thicknesses have been investigated. The planar and cross morphologies as well as the surface charge distribution were investigated as a function o ...
Elsevier2017The growth by laser ablation and electronic properties of thin cuprate films
In my thesis work I have concentrated on the growth and the in-depth analysis of high temperature superconducting thin films with the central aim to elucidate their electronic properties, predominantly by in-situ angle resolved photoemission spectroscopy ( ...
EPFL2008Direct angle resolved photoelectron spectroscopy (DARPES) on high-Tc films: doping, strains, Fermi surface topology and superconductivity - art. no. 012040
Davor Pavuna, Dominique Cloëtta, Claudia Cancellieri, Mike Abrecht
Since 1997 we systematically perform Direct ARPES (=DARPES) on in-situ grown, non-cleaved, ultra-thin (
Iop Publishing Ltd, Dirac House, Temple Back, Bristol Bs1 6Be, England2008Direct angle resolved photoemission spectroscopy and superconductivity of strained high-T-c films
Davor Pavuna, Dominique Cloëtta, Claudia Cancellieri, Mike Abrecht
Since 1997 we systematically perform direct angle resolved photoemission spectroscopy (ARPES) on in-situ grown thin (
2008Fermi surface determination from wavevector quantization in LaSrCuO films
Davor Pavuna, Claudia Cancellieri, Ping-Hui Lin
We have observed the wavevector quantization in LaSrCuO films thinner than 12 unit cells grown on SrTiO3 substrates. Low energy dispersions were determined in situ for different photon energies by angle resolved photoemission spectroscopy. From the wavevec ...
2008Embedded polytypes in Bi2Sr2-xLaxCuO6 thin films grown by laser ablation
Davor Pavuna, Claudia Cancellieri, Ping-Hui Lin
We investigate the presence of secondary phases in La-doped Bi-2201 thin films grown by laser ablation. The cation ratios in the target material, the oxygen pressure, and the substrate temperature during the deposition are the main parameters determining t ...
2007Three-dimensional dispersion induced by extreme tensile strain in La_(2−x)Sr_xCuO_4 films
Davor Pavuna, Slobodan Mitrovic, Dominique Cloëtta, Claudia Cancellieri, Mike Abrecht
The electronic band structure probed by angle-resolved photoemission spectroscopy on thin epitaxial La_(2−x)Sr_(x)CuO_(4) films under extreme tensile strain shows anomalous features compatible with c-axis dispersion. This result is in striking contrast wit ...
2006