Skip to main content

Search

Show all results for

Home

Person

Frédéric Sirois

This person is no longer with EPFL

About
Privacy
Disclaimer

Copyright © 2025 EPFL, all rights reserved

Graph Chatbot

About this result

This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.

Related publications (10)

Please note that this is not a complete list of this person’s publications. It includes only semantically relevant works. For a full list, please refer to Infoscience.

Status of the European Union Project FASTGRID

Bertrand Dutoit, Frédéric Sirois, Bertrand Dutoit, Mathias Noe

High voltage direct current super-grids are one attractive solution for the transmission of bulk power of renewable electricity over long distances. Their protection is still an issue and superconducting fault current limiters (SCFCL) offer attractive pers ...

IEEE Institute of Electrical and Electronics Engineers2019

Resistivity of REBCO tapes in overcritical current regime: impact on superconducting fault current limiter modeling

Francesco Grilli, Nicolo' Riva, Bertrand Dutoit, Frédéric Sirois, Bertrand Dutoit

A detailed knowledge of the resistivity of high-temperature superconductors in the overcritical current regime is important to achieve reliable numerical simulations of applications such as superconducting fault current limiters. We have previously shown t ...

2020

Evaluation of the Applicability of Phenomenological HTS Models for Numerical Analysis of Quenches in Coated Conductors: Simulations vs. Experiments

François Roy, Frédéric Sirois, Bertrand Dutoit, Bertrand Dutoit

The electrical resistivity of coated conductors is strongly related to the inter-dependent set of parameters (J, H, T), respectively current density, magnetic field and temperature. On the one hand, it is difficult to isolate the contribution of each of th ...

IEEE Institute of Electrical and Electronics Engineers2011