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Jeremy Béguelin

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Jeremy Béguelin

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On the assessment of aspheric refractive microlenses

Optical characterization of high numerical aperture microlenses for quality assessment and fabrication process optimization

Tolerancing the surface form of aspheric microlenses manufactured by wafer-level optics techniques

Correction of surface error occurring in microlenses characterization performed by optical profilers

Improvements on the uniformity of large-area microlens arrays in Fused Silica

Specification of aspherical surfaces used as refractive elements in micro-optical systems

Leveraging wafer-level manufacturing process limitations to increase large scale fused silica microlens array uniformity

Assessing microlens quality based on 3D irradiance measurement at the focal spot area

Improved calibration of vertical scanning optical profilometers for spherical profiles measurements