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Georg Fantner

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High-frequency multimodal atomic force microscopy

Analysis of local deformation effects in resistive strain sensing of a submicron-thickness AFM cantilever

PLL-based high-speed demodulation of FM signals for real-time AFM applications

Increased imaging speed and force sensitivity for bio-applications with small cantilevers using a conventional AFM setup

A vibration suppression approach to high-speed atomic force microscopy

Automatic lateral resonance identification from cantilever deflection information in high speed atomic force microscopy

Focused electron beam induced deposition: A perspective

Large-scale analysis of high-speed atomic force microscopy data sets using adaptive image processing

Indirect identification and compensation of lateral scanner resonances in atomic force microscopes

Compensator design for improved counterbalancing in high speed atomic force microscopy