Anna Krammer

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Study of Si doped VO2 thin films for solar thermal applications

Andreas Schueler, Anna Krammer, Olivia Valérie Charlotte Bouvard

A new generation of smart solar thermal collectors is based on thermochromic thin film technology. Thermochromic absorber coatings change their optical properties with temperature, particularly in the infrared range. In order to prevent overheating, the co ...

Elsevier Science Bv2017

Van der Waals MoS2/VO2 heterostructure junction with tunable rectifier behavior and efficient photoresponse

Mihai Adrian Ionescu, Olivier Martin, Arnaud Magrez, Andreas Schueler, Igor Stolichnov, Anna Krammer, Teodor Rosca, Emanuele Andrea Casu, Nicolò Oliva, Chen Yan

Junctions between n-type semiconductors of different electron affinity show rectification if the junction is abrupt enough. With the advent of 2D materials, we are able to realize thin van der Waals (vdW) heterostructures based on a large diversity of mate ...

Nature Research2017

Hybrid phase-change — Tunnel FET (PC-TFET) switch with subthreshold swing < 10mV/decade and sub-0.1 body factor: Digital and analog benchmarking

Mihai Adrian Ionescu, Anna Krammer, Teodor Rosca, Josef Andreas Schuler, Wolfgang Amadeus Vitale, Cem Alper, Arnab Biswas, Emanuele Andrea Casu, Nicolò Oliva

In this paper we report the first hybrid Phase-Change - Tunnel FET (PC-TFET) device configurations for achieving a deep sub-thermionic steep subthreshold swing at room temperature and subthreshold power savings. The proposed hybrid device feedbacks the ste ...

IEEE2016

In situ photoelectron spectroscopic characterization of reactively sputtered, doped vanadium oxide thin films

Andreas Schueler, Anna Krammer, Rosendo Sanjines, Olivia Valérie Charlotte Bouvard

Thin films of pure vanadium oxide (VOx) and Ge doped vanadium oxide (VOx:Ge) have been deposited by reactive magnetron sputtering on Si (100) substrates. These films were characterized by means of in situ X-ray photoelectron spectroscopy and ultraviolet ph ...

Wiley-Blackwell2016

In situ core-level and valence-band photoelectron spectroscopy of reactively sputtered tungsten oxide films