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Injection molding is known to create a layered anisotropicmorphologyacross the sample thickness due to varying shear and cooling ratesduring the manufacturing process. In this study, scanning small-angleX-ray scattering was used to visualize and quantify t ...
The imaging of integrated circuits across different length scales is required for failure analysis, design validation and quality control. At present, such inspection is accomplished using a hierarchy of different probes, from optical microscopy on the mil ...
The development of small-angle scattering tensor tomography has enabled the study of anisotropic nanostructures in a volume-resolved manner. It is of great value to have reconstruction methods that can handle many different nanostructural symmetries. For s ...
The success of plastics heavily relies on fast melt processing methods used for large-scale industrial manufacturing, including injection molding. The hierarchical structure of the solid polymer depends on material selection combined with processing condit ...
Three-dimensional inspection of nanostructures such as integrated circuits is important for security and reliability assurance. Two scanning operations are required: ptychographic to recover the complex transmissivity of the specimen, and rotation of the s ...
