Publication

Transmission Electron-Microscopy of Surfaces and Interfaces

Philippe Buffat, Pierre Stadelmann, Jean-Daniel Ganière
1993
Journal paper

Abstract

Modern transmission electron microscopes offer imaging capabilities down to the atomic lattice resolution, as well as crystallographic and chemical microanalysis with 2-nanometer diameter probes in thin foils. These analytical microscopes are powerful tools for surface, interface and thin films studies.

Official source

https://infoscience.epfl.ch/record/110842?ln=en

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Transmission Electron-Microscopy of Surfaces and Interfaces

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