Nanometric crystal defects in transmission electron microscopy
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Information for phase identification may be gathered in the electron transmission microscope with spatial resolution down to the nanometre scale. Energy dispersive X-ray and electron energy loss spectrometries are based on inelastic electron/sample interac ...
Information for phase identification may be gathered in the electron transmission microscope with spatial resolution down to the nanometre scale. Energy dispersive X-ray and electron energy loss spectrometries are based on inelastic electronsample interact ...
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