Modeling of Si 2p core-level shifts at Si-(ZrO2)(x)(SiO2)(1-x) interfaces
Related publications (34)
Graph Chatbot
Chat with Graph Search
Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.
DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.
We report on the experimental investigation of a high-frequency (1 MHz-1.8 GHz) dielectric dispersion in unpoled and poled Pb(Zr,Ti)O-3 ceramics. Two overlapping loss peaks could be revealed in the dielectric spectrum. The linear dependence between the low ...
In this paper we propose a novel information theoretic criterion for optimizing the linear combination of classifiers in multi stream automatic speech recognition. We discuss an objective function that achieves a trade-off between the minimization of a bou ...
Models of amorphous (HfO2)x(SiO2)(1), for varying hafnium, content x are generated by ab initio molecular dynamics. The structural properties are analyzed in terms of pair distribution functions from which typical bond lengths and coordination numbers are ...
Through the sequential use of classical molecular dynamics and first-principles relaxation methods, we generate an abrupt model interface for the 4H(0001)SiC-SiO2 interface showing regular structural parameters without any coordination defect. The valence ...
Change detection plays a very important role in real-time image analysis, e.g., detection of intruders. One key issue is robustness to varying illumination conditions. We propose two techniques for change detection that have been developed to deal with var ...
We formulate the tomographic reconstruction problem in a variational setting. The object to be reconstructed is considered as a continuous density function, unlike in the pixel-based approaches. The measurements are modeled as linear operators (Radon trans ...
Retardation data captured by polarimetric stress-measurements in optical fibers have been reinterpreted in terms of both stress and inelastic strain. The linear dependence of strain birefringence on fiber drawing tension defines the Kohlrausch-Williams-Wat ...
The Bit formation using atomic force microscopy (AFM) was studied on 270-nm-thick < 111 > preferentially oriented Pb(Zr0.4Ti0.6)O-3 (PZT) films prepared by the sol-gel process. To minimize the cantilever-sample capacitive farce interaction, the experiment ...
Retardation data captured by polarimetric stress-measurements in optical fibers have been reinterpreted in terms of both stress and inelastic strain. The linear dependence of strain birefringence on fiber drawing tension defines the Kohlrausch-Williams-Wat ...