Publication

Dielectric effect of a thin SiO2 interlayer at the interface between silicon and high-k oxides

Related publications (63)

About
Privacy
Disclaimer

Graph Chatbot

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

Dielectric effect of a thin SiO2 interlayer at the interface between silicon and high-k oxides

Graph Chatbot

Chat with Graph Search

Collective charge excitations below the metal-to-insulator transition in BaVS3

Label-free detection of Babesia bovis infected red blood cells using impedance spectroscopy on microfabricated flow cytometer

Proton diffusion in amorphous SiO2 and hafnium silicate by Ab Initio molecular dynamics

The Dielectric Response of Room-Temperature Ionic Liquids: Effect of Cation Variation

Polarization effects in the channel of an organic field-effect transistor

Ferroelectric-dielectric tunable composites

Dielectric and infrared properties of ultrathin SiO2 layers on Si(100)

Effects of Maxwell-Wagner polarization on soil complex dielectric permittivity under variable temperature and electrical conductivity

Dielectric Response of Imidazolium-Based Room-Temperature Ionic Liquids

Electronic and dielectric properties of a suboxide interlayer at the silicon-oxide interface in MOS devices