Near-edge x-ray absorption fine-structure investigation of graphene

Marco Grioni, Daniela Pacilè
American Physical Society, 2008
Journal paper

Abstract

We report the near-edge x-ray absorption fine-structure (NEXAFS) spectrum of a single layer of graphite (graphene) obtained by micromechanical cleavage of highly ordered pyrolytic graphite on a SiO2 substrate. We utilized a photoemission electron microscope to separately study single-, double-, and few-layers graphene samples. In single- layer graphene we observe a splitting of the pi* resonance and a clear signature of the predicted interlayer state. The NEXAFS data illustrate the rapid evolution of the electronic structure with the increased number of layers.

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We have performed a near-edge X-ray absorption fine-structure (NEXAFS) and a transmission electron microscopy (TEM) investigation of freely suspended graphene oxide (GO) sheets. We utilized a photoemission electron microscope to identify GO membranes and to acquire C K and 0 K absorption spectra. The overall line shape of C K-edge spectra demonstrates that the honeycomb carbon network of graphene is the scaffold of GO. However, the intensity ratio of pi* and sigma* resonances, and a broad feature at about 20 eV from the edge, indicate the presence of new carbon bonds. The 0 K-edge spectra show that oxidized regions are made of carbonyl, epoxide, and hydroxyl groups attached to the plane of graphene, while carboxyl groups might also be present at the edges. Further, our study indicates the presence of ordered arrangements of oxygen atoms in GO sheets. Our investigation provides a new and efficient route to study the electronic structure of suspended membranes. (C) 2010 Elsevier Ltd. All rights reserved.

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Vertical heterostructures of MoS2 and WSe2 layers are studied by spectroscopic photoemission electron microscopy as an effective technique for correlating chemical and electronic states at the micrometer scale. Element-specific, surface-sensitive images recorded at high lateral and energy resolution from core-level photoelectrons using different laboratory excitation sources are postprocessed to obtain laterally resolved maps of elemental composition and energy shifts in the Mo3d spectra of a few hundred meV. For monolayer MoS2, the method reveals substrate-dependent charge transfer properties within the narrow energy range of 360 meV, with MoS2 becoming more n-type after transfer onto WSe2. The band structure data from momentum microscopy taken over the same areas confirm the charge transfer from WSe2 to MoS2 by the shift of the K-bands away from the Fermi level and illustrates the layer-specific contributions to the electronic band structure of the heterostructure. From work function mapping, the reconstructed energy-level diagram reveals a type II heterostructure but with a very small conduction-band offset.

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