Advanced Scanning Probes for Micro-Nano Science Researches
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We report on the first successful operation of a scanning force microscope using microfabricated capacitive force sensors. The sensors, which are made from single crystal silicon on insulator wafers, consist of a cantilever spring with integrated tip at th ...
In the present article we describe a new setup for an atomic force microscope in the beetle-type geometry. The microscope consists of a compact head standing on three piezo legs with a fourth central piezo carrying the cantilever tip. We use the laser beam ...
Lithography on (100) single-crystal silicon and amorphous silicon is performed by electric-field-enhanced local oxidation of silicon using an atomic force microscope (AFM). Amorphous silicon is used as a negative resist to pattern silicon oxide, silicon ni ...
We present an atomic force microscope ~AFM for operation at low temperatures under ultrahigh vacuum conditions. It uses the laser beam deflection method to measure the bending of the cantilever. The four quadrant photodiode allows the detection of vertical ...
Fluorescence resonance energy transfer (FRET) was obsd. between donor dye mols. deposited onto the sample surface and acceptor dye mols. deposited onto the scanning near-field optical microscope (SNOM) or at. force microscope tip. FRET was obsd. only when ...
The velocity and humidity dependence of nanoscopic sliding friction has been studied on CrN and diamondlike carbon surfaces with an atomic force microscope. The surface wettability is found to be decisive. Partially hydrophilic surfaces show a logarithmic ...
When two objects of subwavelength size interact in the presence of a light beam, a spatially confined electromagnetic field arises in a small spatial region located at the immediate proximity of the particles. In scanning probe microscopy, such induced sho ...
We have fabricated an xy-microstage with integrated protruding tip and electrostatic comb actuators for scanning probe surface imaging. This device, which is micromachined in monocrystalline silicon, nas been actuated and characterized and, for the first t ...
We performed lateral force microscopy on thiolipid Langmuir-Blodgett (LB) films physisorbed on mica substrates with a silicon tip of an at. force microscope. The structure of condensed domains, reflecting their sym. morphol., was obsd. The lateral (frictio ...
