Publication

Components for high speed atomic force microscopy

Related publications (47)

Graph Chatbot

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

Stress and aging minimization in photoplastic AFM probes

Jürgen Brugger, Luis Guillermo Villanueva Torrijo

Photostructurable epoxy based resists, like SU-8, are soft materials with a Young's Modulus around 4 GPa, which makes them particularly suitable as base material to fabricate Atomic Force Microscopy (AFM) probes for non-destructive analysis of fragile samp ...

2008

Micro and nano tools for magnetic field imaging

Schahrazede-Lila Mouaziz

Scanning probe microscopy has become, nowadays, a branch of microscopy widely used to image surfaces of different specimens. Among the various applications, the magnetic imaging is one of the most exciting scanning probe microscopy techniques. It allows th ...

EPFL2007

Small AFM cantilevers for biological applications

Since its development in 1986, the Atomic force microscope (AFM) has become a revolutionary tool for surface analysis. AFM is of special interest to biologists because of its ability to operate in liquids. Applications include imaging molecules, cells, tis ...

2006

Massively parallel AFM with digital holographic readout

Laurent Sache

The general idea of Nanotechnology is not new – it has been studied since Nobel laureate Richard Feynman outlined the idea in a speech in 1959 – but it's only recently that the progress carried out in the various fields of material, optic, physic and engin ...

EPFL2006

An integrated micro-Hall probe for scanning magnetic microscopy

Giovanni Boero, Radivoje Popovic, Pavel Kejik

Anewmicrosystem with the ability to detect magnetic microstructures based on the non-invasive Hall principle is presented. The micro-Hall plate embedded in the microsystem and scaled down to the physical limits of the employedCMOStechnology has an active a ...

Elsevier2006

Modified atomic force microscopy cantilever design to facilitate access of higher modes of oscillation

Luis Guillermo Villanueva Torrijo

The detection of higher modes of oscillation in atomic force microscopy can provide additional information on sample properties. However, the limited bandwidth of the photodiode in the beam deflection detection technique often limits the detectable frequen ...

2006

Special cantilever geometry for the access of higher oscillation modes in atomic force microscopy

Luis Guillermo Villanueva Torrijo

Employing higher oscillation modes of microcantilevers promises higher sensitivity when applied as sensors, for example, for mass detection or in atomic force microscopy. Introducing a special cantilever geometry, we show that the relation between the reso ...

2006

Data acquisition system for high speed atomic force microscopy

Georg Fantner

With the development of atomic force microscopes that allow higher scan speeds, the need for data acquisition systems (DAQ) that are capable of handling the increased amounts of data in real time arises. We have developed a low cost data acquisition and sc ...

2005

Micromechanical testing of SU-8 cantilevers

Jürgen Brugger

SU-8 is a photoplastic polymer with a wide range of possible applications in microtechnology. Cantilevers designed for atomic force microscopes were fabricated in SU-8. The mechanical properties of these cantilevers were investigated using two microscale t ...

2005

Small SiN AFM Cantilevers for High Frequency Application

Jürgen Brugger, Johannes Steen

‘Real-time’ nanoscale imaging and single molecule force spectroscopy of bio-chemical specimen based on atomic force microscopy (AFM) requires cantilevers with both low force constant and high-resonant frequency. The required spring constant should be betwe ...

2004