Design criteria for scanning tunneling microscopes to reduce the response to external mechanical disturbances
Related publications (32)
Graph Chatbot
Chat with Graph Search
Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.
DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.
NOVELTY - The scanning method involves generating data signal using a sensor. The first component based on a motion in a first direction of an actuator configured to provide motion between a sample and a probe in the first direction, the first direction su ...
We report the first use of polymethylmethacrylate (PMMA) optical fiber-made probes for scanning near-field optical microscopy (SNOM). The sharp tips were prepared by chemical etching of the fibers in ethyl acetate, and the probes were prepared by proper gl ...
A detailed structural analysis of the surface supported self-assembly of terphenyl-4,4′′-dicarbonitrile molecules (NC−Ph3−CN) linked by Co adatoms on Ag(111) reveals different surface patterns depending on the constraints applied to the system. Without con ...
The general idea of Nanotechnology is not new – it has been studied since Nobel laureate Richard Feynman outlined the idea in a speech in 1959 – but it's only recently that the progress carried out in the various fields of material, optic, physic and engin ...
The design, modeling, fabrication and characterization of triplate differential capacitive sensors employed in novel on-chip tensile and compression material testing systems are reported, where the capacitive sensors are integrated to measure the load on t ...
NOVELTY - The microscope (11) has a set of four actuators (14, 16, 18, 20) i.e. piezoelectric actuators, and a strain gauge coupled to two opposed actuators (14, 18), arranged in opposed push or push-pull configuration to measure the differential motion of ...
This thesis presents the development of a scattering scanning near-field microscope (s-SNOM) and investigations on the photoluminescence study of solid C60. The first part concerns setting up of such a scattering SNOM where a tuning fork with an attached A ...
The operation of the scanning near-field optical microscope based on the double-resonant montage of a fiber probe onto the tuning fork (working frequency of the latter, that is 32 kHz, coincides with the second resonance frequency of the bending oscillatio ...
SPIE-INT SOC OPTICAL ENGINEERING, PO BOX 10, BELLINGHAM, WA 98227-0010 USA2007
This paper presents a simple, cost-effective and robust atomic force microscope (AFM), which has been purposely designed and built for use as a teaching aid in undergraduate controls labs. The guiding design principle is to have all components be open and ...
In this thesis, ultra-thin dielectric layers on metal substrates are studied mainly by scanning tunneling microscopy and scanning tunneling spectroscopy. In chapter 2, field emission resonances, i.e. bound states in the potential well between sample and ti ...