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Publication
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When a light beam impinges on two interacting objects of subwavelength size, a spatially confined electromagnetic field arises in the immediate proximity of the particles. In scanning probe microscopy, short-range forces induced by this electromagnetic near-field change the magnitude of the probe tip-substrate interaction. In this letter we analyse the physical process responsible for these forces in the context of the localized field susceptibility method.
Olivier Martin, Andrei Kiselev
Marcos Rubinstein, Farhad Rachidi-Haeri