Compensator design for improved counterbalancing in high speed atomic force microscopy
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The accuracy and repeatability of atomic force microscopy (AFM) imaging significantly depend on the accuracy of the piezoactuator. However, nonlinear properties of piezoactuators can distort the image, necessitating sensor-based closed-loop actuators to ac ...
We present an atomic force microscope (AFM) head for optical beam deflection on small cantilevers. Our AFM head is designed to be small in size, easily integrated into a commercial AFM system, and has a modular architecture facilitating exchange of the opt ...
The possibility of many new applications and novel scientific observations can be provided by efficient and reliable high-speed atomic force microscopy techniques. However, the reliability of the AFM images decreases significantly as the imaging speed is i ...
The shape and dimensions of an atomic force microscope tip are crucial factors to obtain high resolution images at the nanoscale. When measuring samples with narrow trenches, inclined sidewalls near 90 or nanoscaled structures, standard silicon atomic forc ...
Improving the imaging speed of atomic force microscopy (AFM) requires accurate nanopositioning at high speeds. However, high speed operation excites resonances in the AFM's mechanical scanner that can distort the image, and therefore typical users of comme ...
The aim of the present PhD thesis is the elaboration of new, home-made Scanning Near-field Optical Microscope (SNOM or NSOM), and the demonstration of its great potential for high-resolution topography and fluorescence investigations of soft and solid samp ...
We introduce quantum point contact microscopy (QPCM) as a novel method for surface characterization, where the conductance through a quantum point contact formed by a metal atom between the tip of a scanning tunneling microscope and the surface is mapped a ...
The combination of the topographic resolution of Scanning Probe Microscopy with the subwavelength information of light/matter interaction leads to a new instrument called Scanning Near-field Optical Microscope (SNOM). This new instrument is an ideal tool t ...
In this paper, we present a detailed investigation into the suitability of atomic force microscopy (AFM) cantilevers with integrated deflection sensor and micro-actuator for imaging of soft biological samples in fluid. The Si cantilevers are actuated using ...
The quartz tuning fork based probe {e.g., Akiyama et al. [Appl. Surf. Sci. 210, 18 (2003)]}, termed "A-Probe," is a self-sensing and self-actuating (exciting) probe for dynamic mode atomic force microscope (AFM) operation. It is an oscillatory force sensor ...