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Impact of lateral non-uniform doping and hot carrier degradation on capacitance behavior of high voltage MOSFETs

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Impact of lateral non-uniform doping and hot carrier degradation on capacitance behavior of high voltage MOSFETs

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High voltage devices for standard MOS technologies

Characterization of effective mobility by split C(V) technique in N-MOSFETs with ultra-thin gate oxides

Evidence for screening effects on the 1/f current noise in GaAs/AlGaAs modulation doped field effect transistors

Depletion and Depolarizing Effects in Ferroelectric Thin-Films and Their Manifestations in Switching and Fatigue

Characterization of effective mobility by split C(V) technique in N-MOSFETs with ultra-thin gate oxides

Evidence for screening effects on the 1/f current noise in GaAs/AlGaAs modulation doped field effect transistors

High voltage devices for standard MOS technologies

Depletion and Depolarizing Effects in Ferroelectric Thin-Films and Their Manifestations in Switching and Fatigue