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Three-dimensional electron imaging of dislocations from a single sample tilt

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Three-dimensional electron imaging of dislocations from a single sample tilt

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Microsecond Time-Resolved Cryo-Electron Microscopy

Measuring electrical properties in semiconductor devices by pixelated STEM and off-axis electron holography (or convergent beams vs. plane waves).

3D reconstruction of curvilinear one-dimensional objects viewed in transmission electron microscopy

In Situ and Time-Resolved Transmission Electron Microscopy of Nanoscale Processes

Correlating cryo-super resolution radial fluctuations and dual-axis cryo-scanning transmission electron tomography to bridge the light-electron resolution gap

One-Dimensional "Ghost Imaging" in Electron Microscopy of Inelastically Scattered Electrons

CryoGAN: A New Reconstruction Paradigm for Single-Particle Cryo-EM Via Deep Adversarial Learning

Reconstruction Methods for Cryo-Electron Microscopy: From Model-based to Data-driven

Diffraction artefacts from twins and stacking faults, and the mirage of hexagonal, polytypes or other superstructures