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Compressed sensing for STEM tomography
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Observing the fast dynamics of nanoscale systems is crucial in order to understand and ultimately control their behavior. Characterizing these dynamic processes requires techniques with atomic spatial resolution and a temporal resolution that matches the t ...
EPFL2023Towards near-atomic resolution imaging of microsecond nanoscale dynamics
Time-resolved electron microscopy has made significant progress in recent years, with some groups now working on instruments that offer attosecond temporal resolution. While much of the research in the field revolves around the improvement of temporal reso ...
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Controlling and shaping radiation beams is fundamental for a better understanding of radiation-matter interaction and advancing experimental techniques for material characterization at high spatial resolution.In particular, the current trend in the miniatu ...
EPFL2023Reconstruction Methods for Cryo-Electron Microscopy: From Model-based to Data-driven
The topic of this thesis is the development of new reconstruction methods for cryo-electron microscopy (cryo-EM). Cryo-EM has revolutionized the field of structural biology over the last decade and now permits the regular discovery of biostructures. Yet, t ...
EPFL2020Monitoring radiation damage in the LHCb Tracker
Elena Graverini, Mark Tobin, Preema Rennee Pais, Pavol Stefko
This paper presents the techniques used to monitor radiation damage in the LHCb Tracker Turicensis during the LHC Runs 1 and 2. Bulk leakage currents in the silicon sensors were monitored continuously, while the full depletion voltages of the sensors were ...
2020Convergent and divergent beam electron holography and reconstruction of adsorbates on free-standing two-dimensional crystals
Van der Waals heterostructures have been lately intensively studied because they offer a large variety of properties that can be controlled by selecting 2D materials and their sequence in the stack. The exact arrangement of the layers as well as the exact ...
HIGHER EDUCATION PRESS2019Three-dimensional imaging of integrated circuits with macro- to nanoscale zoom
Gabriel Aeppli, Manuel Guizar Sicairos, Christian David, Michal Odstrcil
The imaging of integrated circuits across different length scales is required for failure analysis, design validation and quality control. At present, such inspection is accomplished using a hierarchy of different probes, from optical microscopy on the mil ...
NATURE PUBLISHING GROUP2019