In Situ Characterization of Inconel 718 Post-Dynamic Recrystallization within a Scanning Electron Microscope
Graph Chatbot
Chat with Graph Search
Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.
DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.
The effects of neutron irradiation on austenitic stainless steels, usually used for the manufacturing of internal elements of nuclear reactors (e.g. the core shrouds), are the alteration of the microchemistry and the microstructure, and, as a consequence, ...
The deformation mechanisms of silicon {001} surfaces during nanoscratching were found to depend strongly on the loading conditions. Nanoscratches with increasing load were performed at 2 μm/s (low velocity) and 100 μm/s (high velocity). The load-penetratio ...
In this paper we present our latest developments in high precision positioning and handling systems operating inside an SEM. The Laboratory in Scanning Electron Microscope concept (LAB-in-SEM) is proposed along with a description of our piezodriven manipul ...
The focused electron beam induced deposition process is a promising technique for nano and micro patterning. Electrons can be focused in sub-angström dimensions, which allows atomic-scale resolution imaging, analysis, and processing techniques. Before the ...
Oriented films of tetracene and pentacene have been obtained by high vacuum sublimation onto oriented poly(tetrafluoroethylene) (PTFE) substrates. Polymorphism, orientation, and morphology of the pentacene and tetracene films are studied as a function of d ...
We explored degradation in electron-beam-pumped Zn1-xCdxSe/ZnSe laser structures by combining cathodoluminescence (CL) measurements in a scanning electron microscope with transmission electron microscopy. The rate of degradation, measured as the decrease o ...
During nanoindentation measurements of thin films the formation of cracks within the film as well as of pile-up or sink-in around the indent are known to affect significantly the precision of hardness and Young's modulus values. The crack pattern in brittl ...
Abstract In this paper we present our latest developments in high precision positioning and handling systems operating inside Scanning Electron Microscopes (SEM). This work is motivated by the growing need of new instruments for the in-situ analysis of mat ...
We explored the degradation in electron beam pumped Zn1-xCdxSe/ZnSe laser structures by combining cathodoluminescence measurements in a scanning electron microscope with transmission electron microscopy. We found that degradation occurred via the formation ...
The mechanical properties of ultrathin silicon oxide (SiOx ) coatings plasma-deposited on poly(ethylene terephthalate) (PET) films were investigated with particular attention paid to the effect of additives located in the superficial layers of the polymer ...