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Digitally controlled analog proportional-integral-derivative (PID) controller for high-speed scanning probe microscopy

Related publications (54)

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Compact and effective photon-resolved image scanning microscope

Giorgio Tortarolo

Fluorescence confocal laser-scanning microscopy (LSM) is one of the most popular tools for life science research. This popularity is expected to grow thanks to single-photon array detectors tailored for LSM. These detectors offer unique single-photon spati ...

Spie-Soc Photo-Optical Instrumentation Engineers2024

Advances in High-Speed, Multiparametric Atomic Force Microscopy

Santiago Harald Andany

After decades of technological advancements, high-speed atomic force microscopy (HS-AFM) has emerged as a powerful technique for visualizing dynamic processes. At the nanoscale, the AFM provides valuable insights into the sample by sensing minute interacti ...

EPFL2024

Closed-loop technique based on gain balancing for real-time Brillouin optical time-domain analysis

Luc Thévenaz, Zhisheng Yang, Li Zhang, Ana Gabriela Correa Mena

A closed-loop servo control based on balancing the gain of two probing frequencies is proposed for real-time Brillouin optical time-domain analysis (BOTDA) without post-processing. With the most basic BOTDA hardware setup, the system can perform measuremen ...

2022

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A closed-loop servo control based on the gain ratio of two probing frequencies is proposed for fast BOTDA, where the feedback is independent of probe and pump loss, making it robust in harsh environment. ...

Optica Publishing Group2022

Breaking Silos to Guarantee Control Stability with Communication over Ethernet TSN

Amir Aminifar

Editor's notes: The cross-layer approach presented in this article involves co-designing a feedback controller's parameters together with the schedule of an Ethernet network used for communicating state information and control signals.-Samarjit Chakraborty ...

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC2021

An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization

Georg Fantner, Santiago Harald Andany, Charlène Cécile Geneviève Brillard

In this work, we report on the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of imaging and machining of nanoscale structures with sub-nanometer resolution, while the AFM is a ...

BEILSTEIN-INSTITUT2020

Scanning near-field optical microscopy with new probes and feedback modes

Anton Smirnov

Scanning Near-field Optical Microscopy (SNOM) technique enables to overcome Abbe diffraction limit of far-field optics as well as to obtain simultaneously optical and topographical images. While the optical resolution of the method is limited by the apertu ...

EPFL2019

High-speed atomic force microscopy (HS-AFM) is a scanning probe technique capable of recording processes at the nanometre scale in real time. By sequentially increasing the speed of individual microscope components, images of surfaces can be recorded at up ...

EPFL2018

Scanning Gate Microscope for Cold Atomic Gases

Jean-Philippe Brantut, Samuel Häusler

We present a scanning probe microscopy technique for spatially resolving transport in cold atomic gases, in close analogy with scanning gate microscopy in semiconductor physics. The conductance of a quantum point contact connected to two atomic reservoirs ...

American Physical Society2017

Controlled Charging of Ferroelastic Domain Walls in Oxide Ferroelectrics

Tomas Sluka, Li Jin, Ludwig Feigl, Xiankui Wei, Barbara Maraston Fraygola

Conductive domain walls (DWs) in ferroic oxides as device elements are a highly attractive research topic because of their robust and agile response to electric field. Charged DWs possessing metallic-type conductivity hold the highest promises in this aspe ...

Amer Chemical Soc2017