Digitally controlled analog proportional-integral-derivative (PID) controller for high-speed scanning probe microscopy
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In this thesis new imaging approaches for optical microscopy are proposed and studied. They are based on the use of dynamic structured illumination in combination with a demodulation detection concept employing CMOS image detectors. Two particular implemen ...
To improve the performance of atomic force microscopes regarding speed and noise sensitivity, it is important to consider the mechanical rigidity of the actuator (scanner), and the overall mechanical structure. Using finite element analysis in the design p ...
This thesis deals with the development of microfabrication technologies based on photoplastic structuring by lithographic and molding techniques. These technologies, combined with an original releasing method, allow for the simple fabrication of pseudo thr ...
Scanning Electrochemical Microscopy (SECM) is used in combination with copper labeling to visualize roteins on surfaces. Proteins are adsorbed on a poly(vinylidene difluoride) (PVDF) membrane and stained using a standard protocol involving copper salts. Th ...
We performed lateral force microscopy on thiolipid Langmuir-Blodgett (LB) films physisorbed on mica substrates with a silicon tip of an at. force microscope. The structure of condensed domains, reflecting their sym. morphol., was obsd. The lateral (frictio ...
Several approaches are described with the aim of producing near-field optical probes with improved properties. Focused ion beam milling allows the fabrication of small apertures in a controlled fashion, resulting in probes with excellent polarization prope ...
The fluorescence resonance energy-transfer (FRET) process was studied between donor dye mols. deposited on the sample surface and acceptor dye mols. deposited on the tips of scanning near-field and at. force microscopes. The FRET process was obsd. only whe ...
Combining the subwavelength resolution of near-field interactions with the optical contrast mechanisms of classical optical microscopy makes scanning near-field optical microscopy an interesting technique for many applications. In spite of more than ten ye ...
Due to the importance of scanning tunneling microscopy for atomic scale research the anomalously high corrugation values on close packed metal surfaces have been the subject of debate and extensive theoretical work in the past two decades. To date it remai ...
The objective of this work is to fabricate a scanning probe sensor that combines the well-established method for atomic force microscopy, employing a micro-machined Si cantilever and integrated tip, with a probe for the optical near field. A photosensitive ...