Antiferromagnetic MnNi tips for spin-polarized scanning probe microscopy

Spin-polarized scanning tunneling microscopy (SP-STM) measures magnetoresistance with atomic resolution. While various methods for achieving SP probes have been developed, each is limited with respect to fabrication, performance, and operating conditions. In this study, we present the fabrication and use of SP-STM tips made from commercially available antiferromagnetic Mn88Ni12 foils. The tips are intrinsically SP, which is attractive for exploring magnetic phenomena in the zero field limit. The tip material is relatively ductile, is straightforward to etch, and has a Neel temperature exceeding 300 K. We benchmark the topographic and spectroscopic performance of our tips and demonstrate their spin sensitivity by measuring the two-state switching of holmium single atom magnets on MgO/Ag(100). Published by AIP Publishing.

About this result

This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.

Harald Brune, François Patthey, Donat Fabian Natterer, Tobias Bilgeri, Patrick Robert Forrester
2018
Journal paper

Abstract

Official source

https://infoscience.epfl.ch/record/263315?ln=en

About this result

Related concepts (2)

Scanning probe microscopy

Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Gerd Binnig and Heinrich Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe.

Scanning tunneling microscope

A scanning tunneling microscope (STM) is a type of microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1986. STM senses the surface by using an extremely sharp conducting tip that can distinguish features smaller than 0.1 nm with a 0.01 nm (10 pm) depth resolution. This means that individual atoms can routinely be imaged and manipulated.