An Adaptive Parameterization for Efficient Material Acquisition and Rendering

One of the key ingredients of any physically based rendering system is a detailed specification characterizing the interaction of light and matter of all materials present in a scene, typically via the Bidirectional Reflectance Distribution Function (BRDF). Despite their utility, access to real-world BRDF datasets remains limited: this is because measurements involve scanning a four-dimensional domain at sufficient resolution, a tedious and often infeasibly time-consuming process. We propose a new parameterization that automatically adapts to the behavior of a material, warping the underlying 4D domain so that most of the volume maps to regions where the BRDF takes on non-negligible values, while irrelevant regions are strongly compressed. This adaptation only requires a brief 1D or 2D measurement of the material's retro-reflective properties. Our parameterization is unified in the sense that it combines several steps that previously required intermediate data conversions: the same mapping can simultaneously be used for BRDF acquisition, storage, and it supports efficient Monte Carlo sample generation. We observe that the above desiderata are satisfied by a core operation present in modern rendering systems, which maps uniform variates to direction samples that are proportional to an analytic BRDF. Based on this insight, we define our adaptive parameterization as an invertible, retro-reflectively driven mapping between the parametric and directional domains. We are able to create noise-free renderings of existing BRDF datasets after conversion into our representation with the added benefit that the warped data is significantly more compact, requiring 16KiB and 544KiB per spectral channel for isotropic and anisotropic specimens, respectively. Finally, we show how to modify an existing gonio-photometer to provide the needed retro-reflection measurements. Acquisition then proceeds within a 4D space that is warped by our parameterization. We demonstrate the efficacy of this scheme by acquiring the first set of spectral BRDFs of surfaces exhibiting arbitrary roughness, including anisotropy.

Wenzel Alban Jakob

ASSOC COMPUTING MACHINERY2018

A Comprehensive Framework for Rendering Layered Materials

Wenzel Alban Jakob

We present a general and practical method for computing BSDFs of layered materials. Its ingredients are transport-theoretical models of isotropic or anisotropic scattering layers and smooth or rough boundaries of conductors and dielectrics. Following expansion into a directional basis that supports arbitrary composition, we are able to efficiently and accurately synthesize BSDFs for a great variety of layered structures. Reflectance models created by our system correctly account for multiple scattering within and between layers, and in the context of a rendering system they are efficient to evaluate and support texturing and exact importance sampling. Although our approach essentially involves tabulating reflectance functions in a Fourier basis, the generated models are compact to store due to the inherent sparsity of our representation, and are accurate even for narrowly peaked functions. While methods for rendering general layered surfaces have been investigated in the past, ours is the first system that supports arbitrary layer structures while remaining both efficient and accurate. We validate our model by comparing to measurements of real-world examples of layered materials, and we demonstrate an interactive visual design tool that enables easy exploration of the space of layered materials. We provide a fully practical, high-performance implementation in an open-source rendering system. Copyright © ACM.

ACM2014

The Layer Laboratory: A Calculus for Additive and Subtractive Composition of Anisotropic Surface Reflectance

Wenzel Alban Jakob, Tizian Lucien Zeltner

We present a versatile computational framework for modeling the reflective and transmissive properties of arbitrarily layered anisotropic material structures. Given a set of input layers, our model synthesizes an effective BSDF of the entire structure, which accounts for all orders of internal scattering and is efficient to sample and evaluate in modern rendering systems. Our technique builds on the insight that reflectance data is sparse when expanded into a suitable frequency-space representation, and that this property extends to the class of anisotropic materials. This sparsity enables an efficient matrix calculus that admits the entire space of BSDFs and considerably expands the scope of prior work on layered material modeling. We show how both measured data and the popular class of microfacet models can be expressed in our representation, and how the presence of anisotropy leads to a weak coupling between Fourier orders in frequency space. In addition to additive composition, our models supports subtractive composition, a fascinating new operation that reconstructs the BSDF of a material that can only be observed indirectly through another layer with known reflectance properties. The operation produces a new BSDF of the desired layer as if measured in isolation. Subtractive composition can be interpreted as a type of deconvolution that removes both internal scattering and blurring due to transmission through the known layer. We experimentally demonstrate the accuracy and scope of our model and validate both additive and subtractive composition using measurements of real-world layered materials. Both implementation and data will be released to ensure full reproducibility of all of our results.(1)

ASSOC COMPUTING MACHINERY2018

An Adaptive Parameterization for Efficient Material Acquisition and Rendering

Wenzel Alban Jakob

ASSOC COMPUTING MACHINERY2018