Focused ion beamFocused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, a FIB setup uses a focused beam of ions instead.
Low-κ dielectricIn semiconductor manufacturing, a low-κ is a material with a small relative dielectric constant (κ, kappa) relative to silicon dioxide. Low-κ dielectric material implementation is one of several strategies used to allow continued scaling of microelectronic devices, colloquially referred to as extending Moore's law. In digital circuits, insulating dielectrics separate the conducting parts (wire interconnects and transistors) from one another.
Pierce oscillatorThe Pierce oscillator is a type of electronic oscillator particularly well-suited for use in piezoelectric crystal oscillator circuits. Named for its inventor, George W. Pierce (1872–1956), the Pierce oscillator is a derivative of the Colpitts oscillator. Virtually all digital IC clock oscillators are of Pierce type, as the circuit can be implemented using a minimum of components: a single digital inverter, one resistor, two capacitors, and the quartz crystal, which acts as a highly selective filter element.
