Event tree analysisEvent tree analysis (ETA) is a forward, top-down, logical modeling technique for both success and failure that explores responses through a single initiating event and lays a path for assessing probabilities of the outcomes and overall system analysis. This analysis technique is used to analyze the effects of functioning or failed systems given that an event has occurred. ETA is a powerful tool that will identify all consequences of a system that have a probability of occurring after an initiating event that can be applied to a wide range of systems including: nuclear power plants, spacecraft, and chemical plants.
DataIn common usage and statistics, data (USˈdætə; UKˈdeɪtə) is a collection of discrete or continuous values that convey information, describing the quantity, quality, fact, statistics, other basic units of meaning, or simply sequences of symbols that may be further interpreted formally. A datum is an individual value in a collection of data. Data is usually organized into structures such as tables that provide additional context and meaning, and which may themselves be used as data in larger structures.
Socratic methodThe Socratic method (also known as method of Elenchus, elenctic method, or Socratic debate) is a form of cooperative argumentative dialogue between individuals, based on asking and answering questions to stimulate critical thinking and to draw out ideas and underlying presuppositions. It is named after the Classical Greek philosopher Socrates and is introduced by him in Plato's Theaetetus as midwifery (maieutics) because it is employed to bring out definitions implicit in the interlocutors' beliefs, or to help them further their understanding.
Fault injectionIn computer science, fault injection is a testing technique for understanding how computing systems behave when stressed in unusual ways. This can be achieved using physical- or software-based means, or using a hybrid approach. Widely studied physical fault injections include the application of high voltages, extreme temperatures and electromagnetic pulses on electronic components, such as computer memory and central processing units.
