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A dual-shot technique based on the field basis addition of two statistically independent speckle patterns is developed to recover an input polarization through a scattering layer. It is proposed theoretically, and demonstrated both numerically and experimentally that by tuning the linear polarization orientation of the reference speckle pattern to 0 degrees and 45 degrees w.r.t. the x-axis, polarization retrieval of an object beam through a scattering layer can be achieved by measuring the degree of polarization of the superposed speckle pattern. The proposed technique can have a wide range of applications in polarization sensing and biomedical imaging.
Wenzel Alban Jakob, Tizian Lucien Zeltner, Xin Tong