Focused ion beamFocused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, a FIB setup uses a focused beam of ions instead.
Photographic magnitudePhotographic magnitude (mph or mp ) is a measure of the relative brightness of a star or other astronomical object as imaged on a photographic film emulsion with a camera attached to a telescope. An object's apparent photographic magnitude depends on its intrinsic luminosity, its distance and any extinction of light by interstellar matter existing along the line of sight to the observer. Photographic observations have now been superseded by electronic photometry such as CCD charge-couple device cameras that convert the incoming light into an electric current by the photoelectric effect.
