Focused ion beamFocused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, a FIB setup uses a focused beam of ions instead.
Cosmic ray spallationCosmic ray spallation, also known as the x-process, is a set of naturally occurring nuclear reactions causing nucleosynthesis; it refers to the formation of chemical elements from the impact of cosmic rays on an object. Cosmic rays are highly energetic charged particles from beyond Earth, ranging from protons, alpha particles, and nuclei of many heavier elements. About 1% of cosmic rays also consist of free electrons. Cosmic rays cause spallation when a ray particle (e.g. a proton) impacts with matter, including other cosmic rays.
Plasma actuatorPlasma actuators are a type of actuator currently being developed for aerodynamic flow control. Plasma actuators impart force in a similar way to ionocraft. Plasma flows control has drawn considerable attention and been used in boundary layer acceleration, airfoil separation control, forebody separation control, turbine blade separation control, axial compressor stability extension, heat transfer and high-speed jet control.
Ion implantationIon implantation is a low-temperature process by which ions of one element are accelerated into a solid target, thereby changing the physical, chemical, or electrical properties of the target. Ion implantation is used in semiconductor device fabrication and in metal finishing, as well as in materials science research. The ions can alter the elemental composition of the target (if the ions differ in composition from the target) if they stop and remain in the target.
