Publication

Infrared properties of the Si-SiO2 interface from first principles

Related publications (146)

About
Privacy
Disclaimer

Graph Chatbot

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

Infrared properties of the Si-SiO2 interface from first principles

Graph Chatbot

Chat with Graph Search

Electromechanical properties and self-polarization in relaxor Pb(Mg1/3Nb2/3)O-3 thin films

First-principles study of dynamical and dielectric properties of tetragonal zirconia

MEMS spectrometer for infrared gas analysis based on a tunable filter of porous silicon

Ab initio determination of the dielectric response of GaAs, AlAs, C, and SrO in the weighted-density approximation

Phenomenological model of dynamic nonlinear response of relaxer ferroelectrics

Fatigue and nonlinear dielectric response in sol-gel derived lead zirconate titanate thin films

Relaxor Pb(Mg1/3Nb2/3)O-3 thin films and their electromechanical properties

Mechanism of polarization response and dielectric non-linearity of PbMg1/3Nb2/3O3 relaxor ferroelectric

Contributions to the nonlinear dielectric and piezoelectric response of ferroelectric thin films and ceramics

Does freezing in PbMg1/3Nb2/3O3 relaxor manifest itself in nonlinear dielectric susceptibility?