Scanning probe microscopyScanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Gerd Binnig and Heinrich Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe.
Scale-invariant feature transformThe scale-invariant feature transform (SIFT) is a computer vision algorithm to detect, describe, and match local features in images, invented by David Lowe in 1999. Applications include object recognition, robotic mapping and navigation, , 3D modeling, gesture recognition, video tracking, individual identification of wildlife and match moving. SIFT keypoints of objects are first extracted from a set of reference images and stored in a database.
