Publication

Observation and Modification of the Surface of Some Organic Crystals by Means of Atomic Force Microscopy

Related publications (32)

Automated wafer-scale fabrication of electron beam deposited tips for atomic force microscopes using pattern recognition

We present an automation technique for the growth of electron beam deposited tips on whole wafers of atomic force microscope cantilevers. This technique uses pattern recognition on scanning electron microscope images of successive magnifications to precise ...

2004

AFM and SNOM characterization of carboxylic acid terminated silicon and silicon nitride surfaces

Giorgio Margaritondo, Giovanni Longo, Dusan Vobornik

Silicon and silicon nitride surfaces have been successfully terminated with carboxylic acid monolayers and investigated by atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM). On clean Si surface, AFM showed topographical variat ...

2003

Interaction potential and hopping dynamics governing sliding friction

Harald Brune

The friction force on a nanometer-sized tip sliding on a surface is related to the thermally activated hopping of the contact atoms on an effective atomic interaction potential. A general analytical expression relates the height of this potential and the h ...

2003

Charting and unzipping the surface layer of Corynebacterium glutamicum with the atomic force microscope

Henning Paul-Julius Stahlberg, Andreas Engel

Bacterial surface layers (S-layers) are extracellular protein networks that act as molecular sieves and protect a large variety of archaea and bacteria from hostile environments. Atomic force microscopy (AFM) was used to asses the S-layer of Corynebacteriu ...

Wiley-Blackwell2002

Investigation of nanolocal fluorescence resonance energy transfer for scanning probe microscopy

Majed Chergui, Giovanni Dietler

Fluorescence resonance energy transfer (FRET) was obsd. between donor dye mols. deposited onto the sample surface and acceptor dye mols. deposited onto the scanning near-field optical microscope (SNOM) or at. force microscope tip. FRET was obsd. only when ...

1999

Conception and realization of a compact scanning near-field optical microscope

Combining the subwavelength resolution of near-field interactions with the optical contrast mechanisms of classical optical microscopy makes scanning near-field optical microscopy an interesting technique for many applications. In spite of more than ten ye ...

EPFL1998

The dependence of friction anisotropies on the molecular organization of LB films as observed by at. force microscopy

Horst Vogel, Andrzej Kulik, Gérard Gremaud, Martha Liley, Claus Duschl, Dimitrios Stamou

We performed lateral force microscopy on thiolipid Langmuir-Blodgett (LB) films physisorbed on mica substrates with a silicon tip of an at. force microscope. The structure of condensed domains, reflecting their sym. morphol., was obsd. The lateral (frictio ...

1997

Scanning force microscopy in the dynamic mode using microfabricated capacitive sensors

Jürgen Brugger

We report on the first successful operation of a scanning force microscope using microfabricated capacitive force sensors. The sensors, which are made from single crystal silicon on insulator wafers, consist of a cantilever spring with integrated tip at th ...

1996

Native and modified uncoated neurons observed by atomic force microscopy

Giorgio Margaritondo

Dried, fixed uncoated neuron granule cells and their neurites have been imaged in air by an atomic force microscope (AFM) in the repulsive regime of contact mode. Neurons have also been observed after swelling with glutamate or decapping. Modifications ind ...

1996

Design of a ''beetle-type'' atomic force microscope using the beam deflection technique

Klaus Kern, Harald Brune

In the present article we describe a new setup for an atomic force microscope in the beetle-type geometry. The microscope consists of a compact head standing on three piezo legs with a fourth central piezo carrying the cantilever tip. We use the laser beam ...

1996

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