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We performed lateral force microscopy on thiolipid Langmuir-Blodgett (LB) films physisorbed on mica substrates with a silicon tip of an at. force microscope. The structure of condensed domains, reflecting their sym. morphol., was obsd. The lateral (frictio ...
We report on the first successful operation of a scanning force microscope using microfabricated capacitive force sensors. The sensors, which are made from single crystal silicon on insulator wafers, consist of a cantilever spring with integrated tip at th ...
Fluorescence resonance energy transfer (FRET) was obsd. between donor dye mols. deposited onto the sample surface and acceptor dye mols. deposited onto the scanning near-field optical microscope (SNOM) or at. force microscope tip. FRET was obsd. only when ...
In the present article we describe a new setup for an atomic force microscope in the beetle-type geometry. The microscope consists of a compact head standing on three piezo legs with a fourth central piezo carrying the cantilever tip. We use the laser beam ...
We have fabricated an xy-microstage with integrated protruding tip and electrostatic comb actuators for scanning probe surface imaging. This device, which is micromachined in monocrystalline silicon, nas been actuated and characterized and, for the first t ...
A novel silicon microfabricated sensor head for the scanning force microscope (SFM) is presented. The force sensor consists of a cantilever and an adjacent counter-electrode forming the two plates of a capacitor. Force-induced cantilever deflections are mo ...
When two objects of subwavelength size interact in the presence of a light beam, a spatially confined electromagnetic field arises in a small spatial region located at the immediate proximity of the particles. In scanning probe microscopy, such induced sho ...
