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Investigation of Pb(Zr0.70Ti0.30)O-3 thin films of different textures on Ti/Pt electrodes

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Investigation of Pb(Zr0.70Ti0.30)O-3 thin films of different textures on Ti/Pt electrodes

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Atomic-scale investigation of the dielectric screening at the interface between silicon and its oxide

Films minces relaxeur-ferroélectriques à base de Pb(Mg1/3NB2/3)O3

Processing and properties of screen-printed lead zirconate titanate piezoelectric thick films on electroded silicon

Electromechanical properties and self-polarization in relaxor Pb(Mg1/3Nb2/3)O-3 thin films

High resolution study of domain nucleation and growth during polarization switching in Pb(Zr,Ti)O-3 ferroelectric thin film capacitors

Observation of domain nucleation and growth during switching process

Pt-ion-implantation-induced suppression of leakage conduction in Pt/Pb(ZrxTi1-x)O-3/Pt capacitors

Mechanism of polarization response in the ergodic phase of a relaxor ferroelectric

Use of ferroelectric hysteresis parameters for evaluation of niobium effects in lead zirconate titanate thin films

Evidence of domain wall contribution to the dielectric permittivity in PZT thin films at sub-switching fields