Publication

Pt-ion-implantation-induced suppression of leakage conduction in Pt/Pb(ZrxTi1-x)O-3/Pt capacitors

Related publications (76)

Graph Chatbot

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

This thesis is devoted to the study of screening and polarisation effects in a quantum plasma of electrons and protons, when the system is close to a dilute gas of hydrogen atoms. This atomic phase is obtained by considering a coupled low-density and low-t ...

EPFL2002

The effect of magnesium addition on the phase formation, microstructure and electric and ferroelectric properties of LiNbO3 thin films prepared through polymeric precursors was analyzed. By X ray diffraction no secondary phase was observed with the increas ...

2002

, ,

The occurrence of switching-induced suppression of the remanent polarization (fatigue) in Pb(Zr,Ti)O-3 (PZT) ferroelectric capacitors with comb shaped top electrodes was studied by means of scanning force microscopy assisted by a lock-in amplifier. Fatigue ...

2001

Polarization fatigue in ferroelectric films: Basic experimental findings, phenomenological scenarios, and microscopic features

Nava Setter, Alexander Tagantsev, Igor Stolichnov, Enrico Colla

The reduction in switchable polarization of ferroelectric thin films due to electrical stress (polarization fatigue) is a major problem in ferroelectric nonvolatile memories. There is a large body of available experimental data and a number of existing mod ...

2001

Downscaling of Pb(Zr,Ti)O-3 film thickness for low-voltage ferroelectric capacitors: Effect of charge relaxation at the interfaces

Nava Setter, Paul Muralt, Alexander Tagantsev, Igor Stolichnov, Enrico Colla, Stéphane Hiboux

In this communication we address two issues essential for low-voltage memory applications of ferroelectric thin films: the size effect on polarization switching, and polarization fatigue. According to the proposed concept, both of these phenomena are contr ...

2000

The effect of near-by-electrode charge injection on switching of a thin film ferroelectric capacitor is theoretically analyzed. We develop a model of switching affected by charge injection through a surface dielectric layer to calculate the coercive field ...

1999

, ,

Leakage conduction of (Pb, La)(Zr, Ti)O-3 (PLZT) films grown on Pt bottom electrode, with Pt and Pt/SrRuO3 (Pt/SRO) top electrodes is studied. It is found that the conduction behavior of the ferroelectric capacitors strongly varies depending on the degree ...

1999

High figure-of-merit porous Pb1-xCaxTiO3 thin films for pyroelectric applications

Nava Setter, Paul Muralt, Andreas Seifert

The pyroelectric properties of Pb1-xCaxTiO3 (x = 0-0.3) thin films have been greatly improved by including porosity in the microstructure. Control of nucleation and growth by variation of the heating rate was used to process porous, low dielectric constant ...

1998

, ,

It was recently suggested, basing on the analysis of a wide range of macroscopic experimental results([1-4]), that fatigue in ferroelectric thin film capacitors, particularly in the case of PZT with metallic electrodes (Pt), must be related to the freezing ...

1998

Field-adjusted suppression of the switching polarization in ferroelectric PZT thin films with Pt-electrodes

Alexander Tagantsev, Enrico Colla

A surprising non-cumulative effect of the degradation mechanism (fatigue) of the switched polarization (P-r(s)), was observed in MOCVD and sol-gel prepared Pb(Zr0.47Ti0.53)O-3 (PZT) ferroelectric thin films capacitors (FECAP) with Pt-electrodes. This effec ...

1998