Optical nanospectroscopy study of ion-implanted silicon and biological growth medium

Giorgio Margaritondo, Dusan Vobornik
2004
Journal paper

Abstract

The advent of scanning near-field optical microscopy (SNOM) has augmented at the microscopic level the usefulness of IR spectroscopy. Two-dimensional imaging of chemical constituents makes this a very attractive and powerful new approach. In this paper we present SNOM results on boron-doped silicon and on biological growth medium by means of shear-force, reflectivity and photocurrent measurements. Such experiments allowed us to identify boron clusters embedded in silicon and the distribution of growth medium constituents with a lateral resolution well below the diffraction limit. (C) 2003 Elsevier B.V. All rights reserved.

Official source

https://infoscience.epfl.ch/record/89776?ln=en

About this result

This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.

Related concepts

Related publications

Optical nanospectroscopy applications in material science

Giovanni Longo, Giorgio Margaritondo, Dusan Vobornik

The advent of scanning near-field optical microscopy (SNOM) has augmented at a microscopic level the usefulness of optical spectroscopy in the region between 300 nm and 10 mum. Two-dimensional imaging of chemical constituents makes this a very attractive and powerful new approach. In this paper we show SNOM results obtained in several geometrical configurations on boron clusters in silicon, Li clusters embedded in a LiF sample and BN growth on silicon. We also show some results on the wavelength dependence of the reflectivity (R) in the near infrared (IR) of biological cells in liquid environment with the observation of the local fluorescence. The SNOM images revealed features that were not present in the corresponding shear-force (SF) images and which were due to localized changes in the bulk properties of the sample. The size of the smallest detected features clearly demonstrated that near-field conditions were reached both in the visible and infrared region. (C) 2004 Elsevier B.V. All rights reserved.

2004

Scanning near-field infrared microscopy and spectromicroscopy applied to nano-systems and cells

Dusan Vobornik

This thesis further explores the possibilities of scanning near-field optical microscopy (SNOM) in both materials and life sciences. Two experimental SNOM setups were developed: one designed for infrared spectroscopy applications and the other for the imaging of fluorescently labeled samples. The results of the experiments that were conducted with both setups are presented and analyzed in this thesis. Diffraction limits the resolution of lens-based microscopes to a value close to that of the wavelength of the light that is used to illuminate the samples. SNOM instruments overcome this limit by probing the near-field light — the light that remains within close vicinity of the sample and decays exponentially away from it. The SNOM concept and instrumental design are described. A comparison of SNOM with other novel microscopies (electron, atomic force, and scanning tunneling microscopies) outlines the main advantages of SNOM — the sole optical microscopy technique with a nanometer resolution. Aperture-based infrared SNOM (IR-SNOM), performed in the spectroscopic mode using the Vanderbilt University free electron laser, recently started delivering spatially resolved information on the distribution of chemical species and on other laterally fluctuating properties. The IR-SNOM combines the IR spectroscopy's chemical specificity and the SNOM's high optical and topographical resolutions. The IR-SNOM experimental setup is described in detail and results from the study of cells, boron nitride and lithium fluoride thin films are presented and analyzed. They demonstrate the great potential of this new technique. An overview of the development of IR-SNOM, as well as a consideration of its future possibilities are presented. The newly built SNOM instrument at EPFL was used for experiments that are complementary to the aforementioned IR-SNOM experiments. Specifically, the new SNOM enabled the study of fluorescently marked samples. Images of fluorescently labeled cells and carbon nanotubes are presented and analyzed. The results further demonstrate the exciting possibilities of SNOM.

EPFL2005

The infrared (IR) absorption of a biological system can potentially report on fundamentally important microchemical properties. For example, molecular IR profiles are known to change during increases in metabolic flux, protein phosphorylation, or proteolytic cleavage. However, practical implementation of intracellular IR imaging has been problematic because the diffraction limit of conventional infrared microscopy results in low spatial resolution. We have overcome this limitation by using an IR spectroscopic version of scanning near-field optical microscopy (SNOM), in conjunction with a tunable free-electron laser source. The results presented here clearly reveal different chemical constituents in thin films and biological cells. The space distribution of specific chemical species was obtained by taking SNOM images at IR wavelengths ( l) corresponding to stretch absorption bands of common biochemical bonds, such as the amide bond. In our SNOM implementation, this chemical sensitivity is combined with a lateral resolution of 0.1 mum (approximate tolambda1/70), well below the diffraction limit of standard infrared microscopy. The potential applications of this approach touch virtually every aspect of the life sciences and medical research, as well as problems in materials science, chemistry, physics, and environmental research.

2003

Scanning near-field infrared microscopy and spectromicroscopy applied to nano-systems and cells

Dusan Vobornik

EPFL2005