Publication

Use of photoelectron microscopes as X-ray detectors for imaging and other applications

Giorgio Margaritondo
1999
Journal paper

Abstract

We demonstrate with practical tests that a photoelectron emission microscope (PEEM) can be advantageously used as a high-lateral-resolution detector of X-rays. The advantages of this approach are discussed, in particular for coherence-based techniques. (C) 1999 Published by Elsevier Science B.V. All rights reserved.

Official source

https://infoscience.epfl.ch/record/90347?ln=en

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Use of photoelectron microscopes as X-ray detectors for imaging and other applications

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