Système sur une puce

thumb|Puce ARM Exynos sur le smartphone Nexus S de Samsung. Un système sur une puce, souvent désigné dans la littérature scientifique par le terme anglais (d'où son abréviation SoC), est un système complet embarqué sur un seul circuit intégré (« puce »), pouvant comprendre de la mémoire, un ou plusieurs microprocesseurs, des périphériques d'interface, ou tout autre composant nécessaire à la réalisation de la fonction attendue. Il peut également comprendre de la logique, de la mémoire (statique, dynamique, flash, ROM, PROM, EPROM ou EEPROM), des dispositifs (capteurs) mécaniques, opto-électroniques, chimiques ou biologiques et des circuits radio. Exemples d'applications

DIGIC Canon ou EXPEED de Nikon
Processeur Cell du consortium STI
Architecture ARM : Toutes les puces contenant des processeurs ARM Cortex-A, que ce soit Allwinner, Exynos de Samsung, MediaTek, OMAP de Texas Instruments, Rockchip, Tegra de Nvidia, Snapdragon de Qualcomm, Xgene d'APM (destiné aux serv

DeSyRe: On-demand system reliability

Babak Falsafi, Sebastian Isaza, Dionysios Pnevmatikatos

The DeSyRe project builds on-demand adaptive and reliable Systems-on-Chips (SoCs). As fabrication technology scales down, chips are becoming less reliable, thereby incurring increased power and performance costs for fault tolerance. To make matters worse, power density is becoming a significant limiting factor in SoC design, in general. In the face of such changes in the technological landscape, current solutions for fault tolerance are expected to introduce excessive overheads in future systems. Moreover, attempting to design and manufacture a totally defect-/fault-free system, would impact heavily, even prohibitively, the design, manufacturing, and testing costs, as well as the system performance and power consumption. In this context, DeSyRe delivers a new generation of systems that are reliable by design at well-balanced power, performance, and design costs. In our attempt to reduce the overheads of fault-tolerance, only a small fraction of the chip is built to be fault-free. This fault-free part is then employed to manage the remaining fault-prone resources of the SoC. The DeSyRe framework is applied to two medical systems with high safety requirements (measured using the IEC 61508 functional safety standard) and tight power and performance constraints. (C) 2013 Elsevier B.V. All rights reserved.

Elsevier2013

Design of Digital SoC for Operation at High Temperatures

Radisav Cojbasic

There is a growing demand for Systems-on-Chip, integrating microprocessors, on-chip memories, data converters and a variety of sensors, which are capable of reliable operation at high temperatures. For instance, modern aircraft industry demands microcontrollers and electric motors to operate at high temperatures, in order to replace present hydraulic structures. This thesis explains how to design digital SoC which are capable of reliable operation at high temperatures. The essential part of this thesis focuses on the design, implementation, fabrication and high-temperature measurements of on-chip Latch based SRAM, PowerPC e200 based microcontroller, digital temperature sensor and Flash A/D converter. Embedded on-chip SRAM modules are one of the most important components in the modern SoC. We analyze thermally-caused failures in the 6T SRAM cell and elaborate on its reliability. Further, we show that Latch based SRAM modules are preferable to 6T SRAM for reliable operation beyond 150C, by comparing two 1kB SRAM modules implemented in standard 0.18um SOI CMOS process. We demonstrate reliable SRAM operation at 275C (fmax = 10MHz, Ptot = 400mW), that is by far the highest reported operating temperature for digital on-chip SRAM module. Designing SoCs for reliable operation at elevated temperatures is a significant challenge, due to increased static leakage current, reduced carrier mobility, and increased electromigration. We propose to customize a PowerPC e200 based SoC by using a dynamically reconfigurable clock frequency, exhaustive clock gating, and electromigration-resistant power distribution network. We fabricated a 20x9mm2 chip implementing this design in 0.35um Bulk CMOS process. We present worldâs first PowerPC based SoC for reliable operation at 225C (fmax = 30MHz, Ptot = 1.2W). This design outperforms previously reported PowerPC based SoCs, which are not operational at temperatures beyond 125C. The on-chip measurements of the p-n junction temperature allow reliability improvements for the SoC that operates at high temperatures. Low-resolution temperature measurements are efficiently used for adjusting the optimal operation frequency and supply voltage. We used the Time-to-Digital conversion technique to design a fully-digital temperature sensor. We designed and simulated a fully-digital 5bit temperature sensor for 10C resolution temperature measurements in between Tj,min = -45C and Tj,max = 125C. Further, using a single clock cycle Time-to-Digital conversion technique, we present a fully-digital 5bit Pulse based Flash ADC implemented in 0.18um Bulk CMOS process. Measurement results demonstrate the state-of-the-art power efficiency result of 450 fJ/conv (fmax = 83MHz, Ptot = 900uW).

EPFL2014

Design of Digital SoC for Operation at High Temperatures

Radisav Cojbasic

EPFL2014

DeSyRe: On-demand system reliability

On-chip synthesis of oxide nanoparticles with subsequent size detection in a size detection device

Design of Digital SoC for Operation at High Temperatures

DeSyRe: On-demand system reliability

On-chip synthesis of oxide nanoparticles with subsequent size detection in a size detection device

Design of Digital SoC for Operation at High Temperatures