Giorgio Margaritondo, Davor Pavuna, Dominique Cloëtta, Mike Abrecht
Surprising results on electronic properties of strained thin La1.85Sr0.15CuO4 epitaxial films are reported. We report on the very first angle resolved photoemission (ARPES) measurements of the dispersion on in-situ grown, in-plane compressed T-phase LSCO f ...
2003