MICRO-534: Advanced MEMS & microsystemsIn depth analysis of the operation principles and technology of advanced micro- and nanosystems. Familiarisation to their implementation into products and their applications.
EE-567: Semiconductor devices IIStudents will learn about understanding the fundamentals and applications of emerging nanoscale devices, materials
and concepts. Remark: at least 5 students should be enrolled for the course to be giv
AR-241: Building technology IIICe cours traite des divers domaines techniques intervenant dans la conception et la réalisation d'un bâtiment, soit : physique du bâtiment, structures, matériaux, construction et installations techniq
EE-110: Logic systems (for MT)Ce cours couvre les fondements des systèmes numériques. Sur la base d'algèbre Booléenne et de circuitscombinatoires et séquentiels incluant les machines d'états finis, les methodes d'analyse et de syn
EE-523: Advanced analog integrated circuit designIntroduction to advanced topics in analog and mixed-signal CMOS circuits at the transistor level. The course will focus on practical aspects of IC design, quantitative performance measures, and design
CS-471: Advanced multiprocessor architectureMultiprocessors are basic building blocks for all computer systems. This course covers the architecture and organization of modern multiprocessors, prevalent accelerators (e.g., GPU, TPU), and datacen
CS-423: Distributed information systemsThis course introduces the foundations of information retrieval, data mining and knowledge bases, which constitute the foundations of today's Web-based distributed information systems.
EE-381: Electronics IIIComparaison entre les systèmes à composants discrets et les systèmes intégrés. Introduction aux systèmes électroniques numériques et analogiques et à leur interfaçage. Analyse sous forme d'un projet
EE-530: Test of VLSI systemsTest of VLSI Systems covers theoretical knowledge related to the major algorithms used in VLSI test, and design for test techniques. Basic knowledge related to computer-aided design for test technique