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Concept
Scanning tunneling spectroscopy
Résumé
Scanning tunneling spectroscopy (STS), an extension of scanning tunneling microscopy (STM), is used to provide information about the density of electrons in a sample as a function of their energy.
In scanning tunneling microscopy, a metal tip is moved over a conducting sample without making physical contact. A bias voltage applied between the sample and tip allows a current to flow between the two. This is as a result of quantum tunneling across a barrier; in this instance, the physical distance between the tip and the sample
The scanning tunneling microscope is used to obtain "topographs" - topographic maps - of surfaces. The tip is rastered across a surface and (in constant current mode), a constant current is maintained between the tip and the sample by adjusting the height of the tip. A plot of the tip height at all measurement positions provides the topograph. These topographic images can obtain atomically resolved information on metallic and semi-conducting surfaces
However, the scanning tunneling microscope does not measure the physical height of surface features. One such example of this limitation is an atom adsorbed onto a surface. The image will result in some perturbation of the height at this point. A detailed analysis of the way in which an image is formed shows that the transmission of the electric current between the tip and the sample depends on two factors: (1) the geometry of the sample and (2) the arrangement of the electrons in the sample. The arrangement of the electrons in the sample is described quantum mechanically by an "electron density". The electron density is a function of both position and energy, and is formally described as the local density of electron states, abbreviated as local density of states (LDOS), which is a function of energy.
Spectroscopy, in its most general sense, refers to a measurement of the number of something as a function of energy. For scanning tunneling spectroscopy the scanning tunneling microscope is used to measure the number of electrons (the LDOS) as a function of the electron energy.
Source officielle
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