Concept
Tight binding
Personnes associées (39)
Arnaud Magrez
Education
PhD., Materials Science, summa cum laude, Université de Nantes, 2002
M.S., Chemistry, Université des Sciences et Technologies de Lille, 1999
Academic positions
Head of the Crystal Growth Facility, EPFL, 2012-present
Research Associate, Laboratoire de Physique de la Matière Complexe, EPFL, 2003-2012
Research Fellow, Peter Grunberg Institute, FZ-Juelich, 2002-2003
Administrative positions at EPFL
Scientific staff member, EPFL Assembly, 2015-present
Scientific staff member, School Council SB, 2014-present
Member of the IPHYS office 2016-present
Member of the ICMP office 2012-2015
Member of the safety committee of ICMP 2010-2015
Hans Peter Herzig
Dr. Hans Peter Herzig is Professor at the Ecole Polytechnique Fédérale de Lausanne (EPFL) and Past President of the European Optical Society (EOS). His current research interests include refractive and diffractive micro-optics, nano-scale optics and optical MEMS.
Hans Peter Herzig received his diploma in physics from the Swiss Federal Institute of Technology in Zürich, Switzerland, in 1978. From 1978 to 1982 he was a scientist with the Optics Development Department of Kern in Aarau, Switzerland, working in lens design and optical testing. In 1983, he became a graduate research assistant with the Applied Optics Group at the Institute of Microtechnology of the University of Neuchâtel, Switzerland, working in the field of holographic optical elements. In 1987, he received his PhD degree in optics. From 1989 to 2001 he was head of the micro-optics research group in Neuchâtel. From 2002 to 2008 he was a full professor and head of the Applied Optics Laboratory at the University of Neuchâtel. Professor Herzig joined the faculty at EPFL in January 2009.
He is member of OSA, IEEE Photonics Society and Fellow of EOS. 2009-2010 he was President of the European Optical Society (EOS), 2001-2009 Vice-President of the Swiss Society of Optics and Microscopy and 2012-2014 Vice-President of ICO. Dr. Herzig is in the editorial board of different scientific journals (JM3, Optical Review, JEOS). He served as Conference Chairman for international conferences of EOS, IEE, IEEE/LEOS, OSA and SPIE; and as Guest Editor of three special issues of IEEE, OSA journals. He is editor of a well-known book on micro-optics (published in English and Chinese), author of 14 book chapters, over 150 peer reviewed articles and 300 conference proceedings.
Michele Ceriotti
Michele Ceriotti received his Ph.D. in Physics from ETH Zürich in 2010. He spent three years in Oxford as a Junior Research Fellow at Merton College. Since 2013 he leads the laboratory for Computational Science and Modeling in the Institute of Materials at EPFL. His research revolves around the atomic-scale modelling of materials, based on the sampling of quantum and thermal fluctuations and on the use of machine learning to predict and rationalize structure-property relations. He has been awarded the IBM Research Forschungspreis in 2010, the Volker Heine Young Investigator Award in 2013, an ERC Starting Grant in 2016, and the IUPAP C10 Young Scientist Prize in 2018.
Cécile Hébert
Cécile Hébert est née en France, en 1970. Elle a obtenu son diplôme d'ingénieure (option physique) puis son doctorat ("Etude d'un nouveau filtre d'énergie des électrons pour le microscope électronique à transmission") à l'Ecole centrale de Paris. Doctorante dans le laboratoire du professeur Jouffrey, elle a créé un nouveau filtre d'énergie des électrons, pour le microscope électronique à transmission, qui a été breveté par le CNRS.
En tant que post-doctorante dans le laboratoire du professeur Schattschneider, elle a mené à bien une étude marquante sur la simulation des structures fines des seuils de perte d'énergie des électrons en comparaison avec l'expérience. En 2005, elle a été l'une des actrices principales dans l'élaboration du projet européen CHIRALTEM visant à développer dans le microscope électronique à transmission une méthode similaire à la méthode XMCD (X Ray Magnetic Circular Dichroism) connue en spectrométrie d'absorption des rayons X.