Concept

Diffraction-limited system

Publications associées (366)

Homogeneous multifocal excitation for high-throughput super-resolution imaging

Pierre Gönczy, Suliana Manley, Kyle Michael Douglass, Khalid Ashraf Mohie Ibrahim, Davide Gambarotto, Paul Guichard, Virginie Hamel, Denis Fortun, Niccolo Banterle, Dora Mahecic

Super-resolution microscopies have become an established tool in biological research. However, imaging throughput remains a main bottleneck in acquiring large datasets required for quantitative biology. Here we describe multifocal flat illumination for fie ...

NATURE PUBLISHING GROUP2020

Far-Field Subwavelength Acoustic Imaging by Deep Learning

Romain Christophe Rémy Fleury, Bakhtiyar Orazbayev

Seeing and recognizing an object whose size is much smaller than the illumination wavelength is a challenging task for an observer placed in the far field, due to the diffraction limit. Recent advances in near- and far-field microscopy have offered several ...

2020

25th Anniversary of STED Microscopy and the 20th Anniversary of SIM: feature introduction

Suliana Manley

This feature issue commemorating 25 years of STED microscopy and 20 years of SIM is intended to highlight the incredible progress and growth in the field of superresolution microscopy since Stefan Hell and Jan Wichmann published the article Breaking the di ...

OPTICAL SOC AMER2020

Correction of spherical surface measurements by confocal microscopy

Toralf Scharf, Wilfried Noell, Jeremy Béguelin

Refractive microlenses are nowadays widely used in optical systems. Characterizing their surface is essential to ensure their quality and to optimize their fabrication process. This is realized by optical surface profilers thanks to their vertical resoluti ...

2020

Development of novel experimental and computational methods for three-dimensional coherent and super-resolution microscopy

Adrien Charles-François Raymond Descloux

Optical microscopy is one widely used tool to study cell functions and the interaction of molecules at a sub-cellular level. Optical microscopy techniques can be broadly divided into two categories: partially coherent and incoherent. Coherent microscopy te ...

EPFL2020

Diffraction artefacts from twins and stacking faults, and the mirage of hexagonal, polytypes or other superstructures

Cyril Cayron

Recently, a hexagonal phase has been reported in high carbon steels in several studies. Here, we show that the electron microscopy results used in these studies were erroneously interpreted. The extra-spots in the diffraction patterns and the odd contrasts ...

2020

3D nanometrology of transparent objects by phase calibration of a basic bright-field microscope for multiple illumination apertures

Martinus Gijs, Daniel Migliozzi, Bingying Zhao

Optical retrieval of the structure of transparent objects at the nanoscale requires adapted techniques capable of probing their interaction with light. Here, we considered a method based on calibration of the defocusing with partially coherent illumination ...

2020

Holographic reconstruction of interlayer distance of bilayer two-dimensional crystal samples from their convergent beam electron diffraction patterns

Tatiana Latychevskaia

Convergent beam electron diffraction (CBED) patterns of twisted bilayer samples exhibit interference patterns in their CBED spots. Such interference patterns can be treated as off-axis holograms and the phase of the scattered waves, and hence the interlaye ...

2020

Neutron Diffraction and Diffraction Contrast Imaging for Mapping the TRIP Effect under Load Path Change

Helena Van Swygenhoven, Efthymios Polatidis, Markus Strobl

The transformation induced plasticity (TRIP) effect is investigated during a load path change using a cruciform sample. The transformation properties are followed by in-situ neutron diffraction derived from the central area of the cruciform sample. Additio ...

MDPI2020

Characterizing crystalline defects in single nanoparticles from angular correlations of single-shot diffracted X-rays

Christoph Bostedt, Alessandro Colombo, Giorgio Rossi

Characterizing and controlling the uniformity of nanoparticles is crucial for their application in science and technology because crystalline defects in the nanoparticles strongly affect their unique properties. Recently, ultra-short and ultra-bright X-ray ...

INT UNION CRYSTALLOGRAPHY2020

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