Publications associées (36)

Phase calibration of a basic bright-field microscope for 3D metrology of transparent samples at the nanoscale

Martinus Gijs, Daniel Migliozzi, Bingying Zhao

Optical retrieval of the structure of transparent objects at the nano-scale requires adapted methods capable of probing their interaction with suitable light. Scattering events, for instance, depend on the content and the arrangement of the medium encounte ...
SPIE-INT SOC OPTICAL ENGINEERING2021

Leveraging wafer-level manufacturing process limitations to increase large scale fused silica microlens array uniformity

Toralf Scharf, Wilfried Noell, Raoul Kirner, Jeremy Béguelin

The wafer-level production of Fused Silica microlens arrays is limited by systematic process non-uniformities. The common molten resist-reflow process with subsequent dry-etching allows for manufacturing of microlens arrays on 200 mm wafers. A thorough pro ...
SPIE-INT SOC OPTICAL ENGINEERING2019

Demonstration of distributed shape sensing based on Brillouin scattering in multi-core fibers

Luc Thévenaz, Marcelo Alfonso Soto Hernandez, Zhiyong Zhao

In this paper we demonstrate distributed shape sensing based on stimulated Brillouin scattering in a multi-core fiber (MCF). Brillouin optical time-domain analysis with differential pulse-width pairs is implemented to measure the local tangential strain-in ...
Ieee2017

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