Optique en rayons X | EPFL Graph Search

X-ray optics is the branch of optics that manipulates X-rays instead of visible light. It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray crystallography, X-ray fluorescence, small-angle X-ray scattering, X-ray microscopy, X-ray phase-contrast imaging, and X-ray astronomy. Since X-rays and visible light are both electromagnetic waves they propagate in space in the same way, but because of the much higher frequency and photon energy of X-rays they interact with matter very differently. Visible light is easily redirected using lenses and mirrors, but because the real part of the complex refractive index of all materials is very close to 1 for X-rays, they instead tend to initially penetrate and eventually get absorbed in most materials without changing direction much. There are many different techniques used to redirect X-rays, most of them changing the directions by only minute angles. The most common principle used is reflection at grazing incidence angles, either using total external reflection at very small angles or multilayer coatings. Other principles used include diffraction and interference in the form of zone plates, refraction in compound refractive lenses that use many small X-ray lenses in series to compensate by their number for the minute index of refraction, Bragg reflection from a crystal plane in flat or bent crystals. X-ray beams are often collimated or reduced in size using pinholes or movable slits typically made of tungsten or some other high-Z material. Narrow parts of an X-ray spectrum can be selected with monochromators based on one or multiple Bragg reflections by crystals. X-ray spectra can also be manipulated by having the X-rays pass through a filter (optics). This will typically reduce the low-energy part of the spectrum, and possibly parts above absorption edges of the elements used for the filter.

ForMAX - a beamline for multiscale and multimodal structural characterization of hierarchical materials

Yiming Li, Yi Zhang, Marianne Liebi, Vitor Silva, Zhongwen Yao

The ForMAX beamline at the MAX IV Laboratory provides multiscale and multimodal structural characterization of hierarchical materials in the nanometre to millimetre range by combining small- and wide-angle X-ray scattering with full-field microtomography. ...

Int Union Crystallography2024

Electronic structure and lattice dynamics of 1T-VSe2:Origin of the three-dimensional charge density wave

Ji Dai, Lorenzo Monacelli

To characterize in detail the charge density wave (CDW) transition of 1T-VSe2, its electronic structure and lattice dynamics are comprehensively studied by means of x-ray diffraction, muon spectroscopy, angle resolved photoemission (ARPES), diffuse and ine ...

Amer Physical Soc2024

The new X-ray/visible microscopy MAXWELL technique for fast three-dimensional nanoimaging with isotropic resolution

Giorgio Margaritondo, Lin Yang

Microscopy by Achromatic X-rays With Emission of Laminar Light (MAXWELL) is a new X-ray/visible technique with attractive characteristics including isotropic resolution in all directions, large-volume imaging and high throughput. An ultrathin, laminar X-ra ...

NATURE PORTFOLIO2022