Concept

Microscopie à sonde locale

Cours associés (32)

MSE-636(a): Scanning electron microscopy techniques (a)

This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical re

MSE-636(b): Scanning electron microscopy techniques (b)

MICRO-724: Advanced topics in micro- and nanomanufacturing: top-down meets bottom-up

This course introduces advanced fabrication methods enabling the manufacturing of novel micro- and nanosystems (NEMS/MEMS). Both top-down techniques (lithography, stenciling, scanning probes, additive

MICRO-602: Micro-magnetic field sensors and actuators

The course provides the basis to understand the physics, the key performance, and the research and industrial applications of magnetic sensors and actuators. Together with a detailed introduction to m

MSE-704: 3D Electron Microscopy and FIB-Nanotomography

The principles of 3D surface (SEM) reconstruction and its limitations will be explained. 3D volume reconstruction and tomography methods by electron microscopy (SEM/FIB and TEM) will be explained and

MSE-609: 21Intro Scanning electron microscopy techniques

Modern Scanning Electron Microscopes, when combined with Focused Ion Beams (Dual beam FIB-SEM), provide a larger number of multimodal imaging and analysis/characterisation modes at the nano- and micro

EE-517: Bio-nano-chip design

Introduction to heterogeneous integration for Nano-Bio-CMOS sensors on Chip. Understanding and designing of active Bio/CMOS interfaces powered by nanostructures.

ChE-610: Highlights energy research and chemical engineering 1

Synthesis and design of materials for sustainable energ.This seminar series will invite leading researchers from academia, industry, or government agencies to give insightful talks on state-of-the-art

MICRO-561: Biomicroscopy I

Introduction to geometrical and wave optics for understanding the principles of optical microscopes, their advantages and limitations. Describing the basic microscopy components and the commonly used

MSE-619: Nanofabrication with focused electron and ion beams

Nanofabrication with focused charged particle beams (SEM, FIB) and their applications such as lithography, gas assisted deposition / etching, and milling are discussed and the limitations of these pro