Philippe Buffat

Born in Lausanne (Switzerland) in 1942. EPUL physics engineer diploma in 1967 and EPFL PhD in physics in 1976.  From 1966 he studies at the Experimental Physics Laboratory (Prof. J.P. Borel) the physical properties peculiar to the very small size metal crystals and gets a PhD degree for his thesis "Abaissement de la température de fusion de petits cristaux d'or par effet de taille thermodynamique" (Lowering of the melting temperature of small gold crystals by thermodynamic size effect).   In 1971, he starts to develop an electron microscopy facility available to all EPFL students and researchers (nowadays Centre Interdisciplinaire de Microscopie Electronique CIME) that he manages till 2007.  In parallel he teaches the principles of electron microscopy and the Experimental methods of physics at the Physics/Basic Sciences School (SB). In addition, he trains a large part of the facility users.      Honorary professor BS/EPFL he carries-out a free-lance research at CIME and in collaboration with the Institute of Crystallography of the Russian Academy of Sciences (ICRAS, Moscow) and the International Centre of Electron Microscopy for Material Science (IC-EM AGH Krakow)  This activity covers all the techniques related to transmission and scanning electron microscopy applied to materials science and solid-state physics. His interest is directed towards the structure of nanocrystals, their size effects and behavior under strong electron irradiation, the phase transitions in perovskites, the characterization of nanophases, multilayer and interface structures of crystalline materials and bioceramics. More recently a large research part has moved to understanding/pointing-out the adequacy between the limits of the instruments and their interpretation means in regard of their use in a multiusers facility with a large turnover and a wide range of materials/structures.  He is past-president (2006-2007) of the Société Française des Microscopies (Sfµ), honorary member of the Sfµ and of the Swiss Society of Optics and Microscopy (SSOM).