Absolute diffuse reflectance and transmittance FT-IR spectra of optically thin layers of surface-derivatized silica powders are measured, using a photopyroelectric detector placed in direct contact with the sample. The role of inhomogeneities in the surfac ...
An adaptation of Kubelka's general model of diffuse reflectance and diffuse transmittance of light to nonideal scattering samples is proposed. It is applied to quant. Fourier transform IR spectrometry of nondiluted surface-derivatized silica powders. Corre ...