Publications de Michail Symeonidis

High-resolution interference microscopy of binary phase diffractive optical elements

Toralf Scharf, Dong Cheon Kim, Michail Symeonidis

In this work, we apply the high-resolution interference microscopy technique to investigate the intensity and phase of light transmitted through a binary phase element. Using a combination of simulation and experimental results, we identify specific featur ...

2019

Phase resolved characterization of nanoscale features in optical microstructures

Michail Symeonidis

In this study, we apply interferometric microscopy to study the phase, alongside the intensity, of the light field transmitted through a wide variety of samples. Additionally, we conduct those interferometric measurements at different wavelengths within th ...

EPFL2019

High-resolution interference microscopy with spectral resolution for the characterization of individual particles and self-assembled meta-atoms

Toralf Scharf, Michail Symeonidis, Andreas Vetter

We apply a high-resolution interference microscope with spectral resolution to investigate the scattering response of isolated meta-atoms in real space. The final meta-atoms consist of core-shell clusters that are fabricated using a bottom-up approach. The ...

2019

Are Photonic Nanojets Achromatic?

Toralf Scharf, Myun Sik Kim, Michail Symeonidis

In this work we study the evolution of the photonic nanojet (PNJ) phenomenon as the ratio of the sphere's diameter over the illumination wavelength changes, for microspheres with diameters from 2 mu m to 100 mu m. We measure the focal point position by usi ...

SPIE-INT SOC OPTICAL ENGINEERING2019

Diffractive Optical Elements Investigation in the Phase Domain

Toralf Scharf, Myun Sik Kim, Dong Cheon Kim, Michail Symeonidis

In this work we demonstrate the advantages of investigating diffractive optical elements in the phase domain. In this regime we can detect features that are not restrained by the diffraction limit and relate them to the geometrical and optical properties o ...

SPIE-INT SOC OPTICAL ENGINEERING2019

Engineered nanostructures' characterization by spectral interferometric microscopy

Toralf Scharf, Michail Symeonidis

We characterize engineered nanostructures with sizes smaller than half a wavelength using spectrally resolved interferometry. We analyze the response of the meta-atom of interest, which has a raspberry-like geometry. To identify the origin of the response, ...

SPIE-INT SOC OPTICAL ENGINEERING2019

Assessing microlens quality based on 3D irradiance measurement at the focal spot area

Toralf Scharf, Wilfried Noell, Jeremy Béguelin, Michail Symeonidis

During the fabrication process of microlenses, characterization is essential for two purposes: evaluate the optical quality of the element and provide surface information feedback for process optimization. However, no technique can fulfill these two object ...

2018